Corrosion Prediction from Polarization Scans Using an Artificial Neural Network Integrated with an Expert System
Erik M. Rosen, David C. Silverman · CORROSION · 1992
Cited by 74
Author · University of North Carolina at Chapel Hill
Erik M. Rosen, David C. Silverman · CORROSION · 1992
Cited by 74
Erik M. Rosen, Francis X. Canning, Luise S. Couchman · The Journal of the Acoustical Society of America · 1995
Cited by 27
Erik M. Rosen, Kelly D. Sherbondy, James M. Sabatier · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
Cited by 23
Erik M. Rosen, Elizabeth Ayers · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005
Cited by 18
Giorgio V. Borgiotti, Erik M. Rosen · The Journal of the Acoustical Society of America · 1992
Cited by 18
Erik M. Rosen, Frank S. Rotondo, Elizabeth Ayers · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005
Cited by 11
Peter A. Torrione, Kenneth D. Morton, Leslie M. Collins et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004
Cited by 9
Giorgio V. Borgiotti, Erik M. Rosen · The Journal of the Acoustical Society of America · 1994
Cited by 8
Giorgio V. Borgiotti, Erik M. Rosen · The Journal of the Acoustical Society of America · 1992
Cited by 8
Erik M. Rosen, Alex C. Blackburn, Elizabeth Ayers et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003
Cited by 7
Marie E. Fishel, Phillip Koehn, Erik M. Rosen · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014
Cited by 3
Michael T. Tuley, James M. Ralston, Frank S. Rotondo et al. · IEEE Aerospace and Electronic Systems Magazine · 2002
Cited by 3Open access
Erik M. Rosen, Kelly D. Sherbondy · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
Cited by 3
Erik M. Rosen, Elizabeth Ayers · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007
Cited by 2
Erik M. Rosen, Thomas W. Altshuler · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998
Cited by 2