article · Defense Technical Information Center (DTIC) · 1984

A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits

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Abstract

The Gauss-Seidel relaxation method is becoming widely used in the time-domain analysis of large-scale integrated circuits. This research is concerned with the study of the stability properties of point Gauss-Seidel methods when applied to the simulation of MOS circuits. The stability properties of standard Gauss-Seidel and of a modified Gauss-Seidel method with prediction are compared; and a new modified Gauss-Seidel method is proposed which incorporates the desirable properties of both the standard Gauss-Seidel and the one with prediction. The method has been tested in a computer program for the timing analysis of MOS circuits. Keywords include: Integrated Circuits; Time-domain simulation of MOS LSI circuits; and Gauss-Seidel Method.

Cite this paper

APA 7

Anderson, K. C. (1984). A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits. Defense Technical Information Center (DTIC).

MLA 9

Anderson, Keith Clarence. “A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits.” Defense Technical Information Center (DTIC), 1984.

Chicago

Anderson, Keith Clarence. 1984. “A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits.” Defense Technical Information Center (DTIC).

Harvard

Anderson, K.C. (1984) ‘A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits’, Defense Technical Information Center (DTIC).

BibTeX

@article{anderson1984study,
  title = {{A Study of Gauss-Seidel-Type Methods for Simulating Large-Scale Circuits}},
  author = {Anderson, Keith Clarence},
  journal = {Defense Technical Information Center (DTIC)},
  year = {1984}
}

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