article · NASA Technical Reports Server (NASA) · 1993

Detection of CMOS bridging faults using minimal stuck-at fault test sets

Cited by 0Abstract and details only

Abstract

The performance of minimal stuck-at fault test sets at detecting bridging faults are evaluated. New functional models of circuit primitives are presented which allow accurate representation of bridging faults under switch-level simulation. The effectiveness of the patterns is evaluated using both voltage and current testing.

Cite this paper

APA 7

Ijaz, N., & Frenzel, J. F. (1993). Detection of CMOS bridging faults using minimal stuck-at fault test sets. NASA Technical Reports Server (NASA).

MLA 9

Ijaz, Nabeel, and James F. Frenzel. “Detection of CMOS bridging faults using minimal stuck-at fault test sets.” NASA Technical Reports Server (NASA), 1993.

Chicago

Ijaz, Nabeel, and James F. Frenzel. 1993. “Detection of CMOS bridging faults using minimal stuck-at fault test sets.” NASA Technical Reports Server (NASA).

Harvard

Ijaz, N. and Frenzel, J.F. (1993) ‘Detection of CMOS bridging faults using minimal stuck-at fault test sets’, NASA Technical Reports Server (NASA).

BibTeX

@article{ijaz1993detection,
  title = {{Detection of CMOS bridging faults using minimal stuck-at fault test sets}},
  author = {Ijaz, Nabeel and Frenzel, James F.},
  journal = {NASA Technical Reports Server (NASA)},
  year = {1993}
}

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