article · 2005
Functions for Quality Transition Fault Tests
M.K. Michael, Stelios Neophytou, Spyros Tragoudas
Cited by 2Abstract and details only
Abstract
The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.
Cite this paper
Michael, M., Neophytou, S., & Tragoudas, S. (2005). Functions for Quality Transition Fault Tests. https://doi.org/10.1109/isqed.2005.60
Michael, M.K., et al. “Functions for Quality Transition Fault Tests.” 2005, pp. 327–32, https://doi.org/10.1109/isqed.2005.60.
Michael, M.K., Stelios Neophytou, and Spyros Tragoudas. 2005. “Functions for Quality Transition Fault Tests.” https://doi.org/10.1109/isqed.2005.60.
Michael, M., Neophytou, S. and Tragoudas, S. (2005) ‘Functions for Quality Transition Fault Tests’. Available at: https://doi.org/10.1109/isqed.2005.60.
@article{michael2005functions,
title = {{Functions for Quality Transition Fault Tests}},
author = {Michael, M.K. and Neophytou, Stelios and Tragoudas, Spyros},
pages = {327--332},
year = {2005},
doi = {10.1109/isqed.2005.60}
}Made from the index record. Check names, capitalisation and page numbers against the paper. Need another style? AI for Research has over 10,000.
Related papers
A delay fault model for at-speed fault simulation and test generation
Irith Pomeranz, Sudhakar M. Reddy · Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design · 2006
Cited by 7
A Delay Fault Model for At-Speed Fault Simulation and Test Generation
Irith Pomeranz, Sudhakar M. Reddy · Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design · 2006
Cited by 3
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo Takamatsu, H. TAKAHASHI, Yoshinobu Higami et al. · IEICE Transactions on Information and Systems · 2008
Cited by 2Open access
Driving toward higher I/sub DDQ/ test quality for sequential circuits: A generalized fault model and its ATPG
H. Kondo, Kwang-Ting Tim Cheng · International Conference on Computer Aided Design · 2002
Cited by 12
Diagnostic Test Pattern Generation and Fault Simulation for Stuck-at and Transition Faults
Yu Zhang · 2012
Cited by 6
Functional fault models for non-scan sequential circuits
Eduardas Bareiša, Vacius Jusas, Kęstutis Motiejūnas et al. · Microelectronics Reliability · 2011
Cited by 4