article · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988

Circuits for pseudoexhaustive test pattern generation

Cited by 66Abstract and details only

Abstract

Implementation methods based on cyclic codes are presented for pseudoexhaustive testing of combinational logic networks with restricted output dependency. A modified linear-feedback shift register (LFSR) is used to generate exhaustive test patterns for every output of the circuit. All detectable, combinational faults (those that do not change a combinational circuit to a sequential circuit) in each cone of logic driving a single output are guaranteed to be detected. Examples indicate that LFSRs based on cyclic codes have lower hardware cost and shorter or comparable test lengths than other approaches. These test-pattern generators are well suited to applications where short testing time, low hardware overhead, and 100% single-stuck-at fault coverage are required.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

Cite this paper

APA 7

Wang, L., & McCluskey, E. (1988). Circuits for pseudoexhaustive test pattern generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 7(10), 1068–1080. https://doi.org/10.1109/43.7806

MLA 9

Wang, Laung‐Terng, and E.J. McCluskey. “Circuits for pseudoexhaustive test pattern generation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 7, no. 10, 1988, pp. 1068–80, https://doi.org/10.1109/43.7806.

Chicago

Wang, Laung‐Terng, and E.J. McCluskey. 1988. “Circuits for pseudoexhaustive test pattern generation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 7 (10): 1068–80. https://doi.org/10.1109/43.7806.

Harvard

Wang, L. and McCluskey, E. (1988) ‘Circuits for pseudoexhaustive test pattern generation’, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 7(10), pp. 1068–1080. Available at: https://doi.org/10.1109/43.7806.

BibTeX

@article{wang1988circuits,
  title = {{Circuits for pseudoexhaustive test pattern generation}},
  author = {Wang, Laung‐Terng and McCluskey, E.J.},
  journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  volume = {7},
  number = {10},
  pages = {1068--1080},
  year = {1988},
  doi = {10.1109/43.7806}
}

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