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article · Applied Mechanics and Materials · 2015

Testing System Reliability with Exponential Distribution Testing System Reliability

Wei Yan Mu, Jian Jie Chen, Li Ping Zhang

Cited by 0Abstract and details only

Abstract

In this article, we study inferences for reliability functions of the system having two components connected parallel. Suppose that the lifetime of two components have exponential distribution. Using the generalized inference approach, we obtain confidence intervals of our interested parameters with good coverage.

Cite this paper

APA 7

Mu, W. Y., Chen, J. J., & Zhang, L. P. (2015). Testing System Reliability with Exponential Distribution Testing System Reliability. Applied Mechanics and Materials, 740, 727–730. https://doi.org/10.4028/www.scientific.net/amm.740.727

MLA 9

Mu, Wei Yan, et al. “Testing System Reliability with Exponential Distribution Testing System Reliability.” Applied Mechanics and Materials, vol. 740, 2015, pp. 727–30, https://doi.org/10.4028/www.scientific.net/amm.740.727.

Chicago

Mu, Wei Yan, Jian Jie Chen, and Li Ping Zhang. 2015. “Testing System Reliability with Exponential Distribution Testing System Reliability.” Applied Mechanics and Materials 740: 727–30. https://doi.org/10.4028/www.scientific.net/amm.740.727.

Harvard

Mu, W.Y., Chen, J.J. and Zhang, L.P. (2015) ‘Testing System Reliability with Exponential Distribution Testing System Reliability’, Applied Mechanics and Materials, 740, pp. 727–730. Available at: https://doi.org/10.4028/www.scientific.net/amm.740.727.

BibTeX
@article{mu2015testing,
  title = {{Testing System Reliability with Exponential Distribution Testing System Reliability}},
  author = {Mu, Wei Yan and Chen, Jian Jie and Zhang, Li Ping},
  journal = {Applied Mechanics and Materials},
  volume = {740},
  pages = {727--730},
  year = {2015},
  doi = {10.4028/www.scientific.net/amm.740.727}
}

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