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article · IEEE Transactions on Reliability · 2013

Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors

Costas Argyrides, Pedro Reviriego, Juan Antonio Maestro

Cited by 9Abstract and details only

Abstract

Different techniques have been used to deal with defects and soft errors. Repair techniques are commonly used for defects, while error correction codes are used for soft errors. Recently, some proposals have been made to use error correction codes to deal with defects. In this paper, we analyze the impact on reliability of such approaches that use error correction codes, which in addition to soft errors can resolve defects, at the cost of reduced ability to correct soft errors. The results showed that low defect rates or small memory sizes are required to have a low impact on reliability. Additionally, a technique that can improve reliability is proposed and analyzed. The results show that our new approach can achieve a similar reliability in terms of time to failure as that of a defect free memory at the cost of a more complex decoding algorithm.

Cite this paper

APA 7

Argyrides, C., Reviriego, P., & Maestro, J. A. (2013). Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors. IEEE Transactions on Reliability, 62(1), 238–243. https://doi.org/10.1109/tr.2013.2240901

MLA 9

Argyrides, Costas, et al. “Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors.” IEEE Transactions on Reliability, vol. 62, no. 1, 2013, pp. 238–43, https://doi.org/10.1109/tr.2013.2240901.

Chicago

Argyrides, Costas, Pedro Reviriego, and Juan Antonio Maestro. 2013. “Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors.” IEEE Transactions on Reliability 62 (1): 238–43. https://doi.org/10.1109/tr.2013.2240901.

Harvard

Argyrides, C., Reviriego, P. and Maestro, J.A. (2013) ‘Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors’, IEEE Transactions on Reliability, 62(1), pp. 238–243. Available at: https://doi.org/10.1109/tr.2013.2240901.

BibTeX
@article{argyrides2013using,
  title = {{Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors}},
  author = {Argyrides, Costas and Reviriego, Pedro and Maestro, Juan Antonio},
  journal = {IEEE Transactions on Reliability},
  volume = {62},
  number = {1},
  pages = {238--243},
  year = {2013},
  doi = {10.1109/tr.2013.2240901}
}

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