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conference paper · IEEE Symposium on Reliable Distributed Systems (SRDS) · 2013

Automatic Problem Localization via Multi-dimensional Metric Profiling

Ignacio Laguna, Subrata Mitra, Fahad A. Arshad, Nawanol Theera-Ampornpunt, Zongyang Zhu, Saurabh Bagchi, Samuel Pratt Midkiff, Mike Kistler, Ahmed Gheith

Cited by 14Open access

Abstract

Debugging today's large-scale distributed applications is complex. Traditional debugging techniques such as breakpoint-based debugging and performance profiling require a substantial amount of domain knowledge and do not automate the process of locating bugs and performance anomalies. We present Orion, a framework to automate the problem-localization process in distributed applications. From a large set of metrics, Orion intelligently chooses important metrics and models the application's runtime behavior through pair wise correlations of those metrics in the system, within multiple non-overlapping time windows. When correlations deviate from those of a learned correct model due to a bug, our analysis pinpoints the metrics and code regions (class and method within it) that are most likely associated with the failure. We demonstrate our framework with several real-world failure cases in distributed applications such as: HBase, Hadoop DFS, a campus-wide Java application, and a regression testing framework from IBM. Our results show that Orion is able to pinpoint the metrics and code regions that developers need to concentrate on to fix the failures.

Cite this paper

APA 7

Laguna, I., Mitra, S., Arshad, F. A., Theera-Ampornpunt, N., Zhu, Z., Bagchi, S., Midkiff, S. P., Kistler, M., & Gheith, A. (2013). Automatic Problem Localization via Multi-dimensional Metric Profiling. IEEE Symposium on Reliable Distributed Systems (SRDS), 121–132. https://doi.org/10.1109/srds.2013.21

MLA 9

Laguna, Ignacio, et al. “Automatic Problem Localization via Multi-dimensional Metric Profiling.” IEEE Symposium on Reliable Distributed Systems (SRDS), 2013, pp. 121–32, https://doi.org/10.1109/srds.2013.21.

Chicago

Laguna, Ignacio, Subrata Mitra, Fahad A. Arshad, Nawanol Theera-Ampornpunt, Zongyang Zhu, Saurabh Bagchi, Samuel Pratt Midkiff, Mike Kistler, and Ahmed Gheith. 2013. “Automatic Problem Localization via Multi-dimensional Metric Profiling.” IEEE Symposium on Reliable Distributed Systems (SRDS): 121–32. https://doi.org/10.1109/srds.2013.21.

Harvard

Laguna, I. et al. (2013) ‘Automatic Problem Localization via Multi-dimensional Metric Profiling’, IEEE Symposium on Reliable Distributed Systems (SRDS), pp. 121–132. Available at: https://doi.org/10.1109/srds.2013.21.

BibTeX
@article{laguna2013automatic,
  title = {{Automatic Problem Localization via Multi-dimensional Metric Profiling}},
  author = {Laguna, Ignacio and Mitra, Subrata and Arshad, Fahad A. and Theera-Ampornpunt, Nawanol and Zhu, Zongyang and Bagchi, Saurabh and Midkiff, Samuel Pratt and Kistler, Mike and Gheith, Ahmed},
  journal = {IEEE Symposium on Reliable Distributed Systems (SRDS)},
  pages = {121--132},
  year = {2013},
  doi = {10.1109/srds.2013.21}
}

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