article · Electronics Letters · 1991

Reliability of code density test for high resolution ADCs

Cited by 12Abstract and details only

Abstract

The effect of convertor internal noise on its output code histogram is analysed. Simulations show that large linearity errors, including missing codes, may vanish when sufficient noise is experienced. Consequently, the code density test is likely to yield a differential nonlinearity error within ±0.5 LSB for any high accuracy noisy convertor.

Cite this paper

APA 7

Ginetti, B., & Jespers, P. (1991). Reliability of code density test for high resolution ADCs. Electronics Letters, 27(24), 2231–2233. https://doi.org/10.1049/el:19911380

MLA 9

Ginetti, B., and P. Jespers. “Reliability of code density test for high resolution ADCs.” Electronics Letters, vol. 27, no. 24, 1991, pp. 2231–33, https://doi.org/10.1049/el:19911380.

Chicago

Ginetti, B., and P. Jespers. 1991. “Reliability of code density test for high resolution ADCs.” Electronics Letters 27 (24): 2231–33. https://doi.org/10.1049/el:19911380.

Harvard

Ginetti, B. and Jespers, P. (1991) ‘Reliability of code density test for high resolution ADCs’, Electronics Letters, 27(24), pp. 2231–2233. Available at: https://doi.org/10.1049/el:19911380.

BibTeX

@article{ginetti1991reliability,
  title = {{Reliability of code density test for high resolution ADCs}},
  author = {Ginetti, B. and Jespers, P.},
  journal = {Electronics Letters},
  volume = {27},
  number = {24},
  pages = {2231--2233},
  year = {1991},
  doi = {10.1049/el:19911380}
}

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