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article · 2007

Instance Generation for SAT-based ATPG

Daniel Tille, Görschwin Fey, Rolf Drechsler

Cited by 4Abstract and details only

Abstract

Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SAT solvers that have been developed in the last few years. Studies have shown that SAT-based ATPG tools can clearly outperform classical approaches for hard-to-test faults. While the ATPG problem has to be solved on a circuit, SAT solvers work on Conjunctive Normal Forms (CNFs). In this paper the problem to efficiently generate a SAT instance from a circuit is studied. Experimental results on large industrial circuits show the efficiency of the approach.

Cite this paper

APA 7

Tille, D., Fey, G., & Drechsler, R. (2007). Instance Generation for SAT-based ATPG. https://doi.org/10.1109/ddecs.2007.4295272

MLA 9

Tille, Daniel, et al. “Instance Generation for SAT-based ATPG.” vol. 2919, 2007, pp. 1–4, https://doi.org/10.1109/ddecs.2007.4295272.

Chicago

Tille, Daniel, Görschwin Fey, and Rolf Drechsler. 2007. “Instance Generation for SAT-based ATPG.” https://doi.org/10.1109/ddecs.2007.4295272.

Harvard

Tille, D., Fey, G. and Drechsler, R. (2007) ‘Instance Generation for SAT-based ATPG’. Available at: https://doi.org/10.1109/ddecs.2007.4295272.

BibTeX
@article{tille2007instance,
  title = {{Instance Generation for SAT-based ATPG}},
  author = {Tille, Daniel and Fey, Görschwin and Drechsler, Rolf},
  volume = {2919},
  pages = {1--4},
  year = {2007},
  doi = {10.1109/ddecs.2007.4295272}
}

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