article · DROPS (Schloss Dagstuhl – Leibniz Center for Informatics) · 2009

SAT-based Automatic Test Pattern Generation

Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille

Cited by 0Open access

Abstract

Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformation, relevant information about the problem might get lost and therefore is not available in the solving process. In the following we briefly motivate the problem and provide the latest developments in the field. The technique was implemented and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. Significant improvements in overall performance and robustness are demonstrated.

Cite this paper

APA 7

Drechsler, R., Eggersglüß, S., Fey, G., & Tille, D. (2009). SAT-based Automatic Test Pattern Generation. DROPS (Schloss Dagstuhl – Leibniz Center for Informatics), 0. https://doi.org/10.4230/dagsemproc.08351.6

MLA 9

Drechsler, Rolf, et al. “SAT-based Automatic Test Pattern Generation.” DROPS (Schloss Dagstuhl – Leibniz Center for Informatics), 2009, p. 0, https://doi.org/10.4230/dagsemproc.08351.6.

Chicago

Drechsler, Rolf, Stephan Eggersglüß, Görschwin Fey, and Daniel Tille. 2009. “SAT-based Automatic Test Pattern Generation.” DROPS (Schloss Dagstuhl – Leibniz Center for Informatics): 0. https://doi.org/10.4230/dagsemproc.08351.6.

Harvard

Drechsler, R. et al. (2009) ‘SAT-based Automatic Test Pattern Generation’, DROPS (Schloss Dagstuhl – Leibniz Center for Informatics), p. 0. Available at: https://doi.org/10.4230/dagsemproc.08351.6.

BibTeX

@article{drechsler2009based,
  title = {{SAT-based Automatic Test Pattern Generation}},
  author = {Drechsler, Rolf and Eggersglüß, Stephan and Fey, Görschwin and Tille, Daniel},
  journal = {DROPS (Schloss Dagstuhl – Leibniz Center for Informatics)},
  pages = {0},
  year = {2009},
  doi = {10.4230/dagsemproc.08351.6}
}

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