book chapter · 2016
Automatic Test Pattern Generation
Kwang‐Ting Cheng, Li-C. Wang, Huawei Li, James Li
Cited by 2Abstract and details only
Abstract
This chapter focuses on automatic test pattern generation (ATPG). Historically, ATPG has focused on a set of faults derived from a gate-level fault model. For a given target fault, ATPG consists of two phases: fault activation and fault propagation. The objective of ATPG is to find an input sequence that, when applied to the circuit, enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by a particular fault. Effectiveness of ATPG is measured by the fault coverage achieved for the fault model and the number of generated vectors, which should be directly proportional to test application time. ATPG efficiency is another important consideration. The chapter describes circuit-based Boolean satisfiability techniques for solving circuit-oriented problems. It presents advanced ATPG research topics, such as for delay faults, crosstalk, and power supply noise. The chapter discusses ATPG for design applications including logic optimization and design verification.
Cite this paper
Cheng, K., Wang, L.-C., Li, H., & Li, J. (2016). Automatic Test Pattern Generation. https://doi.org/10.1201/b19569-28
Cheng, Kwang‐Ting, et al. “Automatic Test Pattern Generation.” 2016, pp. 559–604, https://doi.org/10.1201/b19569-28.
Cheng, Kwang‐Ting, Li-C. Wang, Huawei Li, and James Li. 2016. “Automatic Test Pattern Generation.” https://doi.org/10.1201/b19569-28.
Cheng, K. et al. (2016) ‘Automatic Test Pattern Generation’. Available at: https://doi.org/10.1201/b19569-28.
@incollection{cheng2016automatic,
title = {{Automatic Test Pattern Generation}},
author = {Cheng, Kwang‐Ting and Wang, Li-C. and Li, Huawei and Li, James},
pages = {559--604},
year = {2016},
doi = {10.1201/b19569-28}
}Made from the index record. Check names, capitalisation and page numbers against the paper. Need another style? AI for Research has over 10,000.