article · Microelectronics Reliability · 1982

A new method for lifetime prediction of electronic devices

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(1982). A new method for lifetime prediction of electronic devices. Microelectronics Reliability, 22(1), 139. https://doi.org/10.1016/0026-2714(82)90127-5

MLA 9

“A new method for lifetime prediction of electronic devices.” Microelectronics Reliability, vol. 22, no. 1, 1982, p. 139, https://doi.org/10.1016/0026-2714(82)90127-5.

Chicago

1982. “A new method for lifetime prediction of electronic devices.” Microelectronics Reliability 22 (1): 139. https://doi.org/10.1016/0026-2714(82)90127-5.

Harvard

(1982) ‘A new method for lifetime prediction of electronic devices’, Microelectronics Reliability, 22(1), p. 139. Available at: https://doi.org/10.1016/0026-2714(82)90127-5.

BibTeX

@article{anon1982method,
  title = {{A new method for lifetime prediction of electronic devices}},
  journal = {Microelectronics Reliability},
  volume = {22},
  number = {1},
  pages = {139},
  year = {1982},
  doi = {10.1016/0026-2714(82)90127-5}
}

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