article · Microelectronics Reliability · 1978

Electronic system thermal design for reliability

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Cite this paper

(1978). Electronic system thermal design for reliability. Microelectronics Reliability, 17(5), 483. https://doi.org/10.1016/0026-2714(78)90874-0

MLA 9

“Electronic system thermal design for reliability.” Microelectronics Reliability, vol. 17, no. 5, 1978, p. 483, https://doi.org/10.1016/0026-2714(78)90874-0.

Chicago

1978. “Electronic system thermal design for reliability.” Microelectronics Reliability 17 (5): 483. https://doi.org/10.1016/0026-2714(78)90874-0.

Harvard

(1978) ‘Electronic system thermal design for reliability’, Microelectronics Reliability, 17(5), p. 483. Available at: https://doi.org/10.1016/0026-2714(78)90874-0.

BibTeX

@article{anon1978electronic,
  title = {{Electronic system thermal design for reliability}},
  journal = {Microelectronics Reliability},
  volume = {17},
  number = {5},
  pages = {483},
  year = {1978},
  doi = {10.1016/0026-2714(78)90874-0}
}

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