article · Microelectronics Journal · 1982

Electron beam finds memory faults, reconfigures chips

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Cite this paper

(1982). Electron beam finds memory faults, reconfigures chips. Microelectronics Journal, 13(6), 42. https://doi.org/10.1016/s0026-2692(82)80176-6

MLA 9

“Electron beam finds memory faults, reconfigures chips.” Microelectronics Journal, vol. 13, no. 6, 1982, p. 42, https://doi.org/10.1016/s0026-2692(82)80176-6.

Chicago

1982. “Electron beam finds memory faults, reconfigures chips.” Microelectronics Journal 13 (6): 42. https://doi.org/10.1016/s0026-2692(82)80176-6.

Harvard

(1982) ‘Electron beam finds memory faults, reconfigures chips’, Microelectronics Journal, 13(6), p. 42. Available at: https://doi.org/10.1016/s0026-2692(82)80176-6.

BibTeX

@article{anon1982electron,
  title = {{Electron beam finds memory faults, reconfigures chips}},
  journal = {Microelectronics Journal},
  volume = {13},
  number = {6},
  pages = {42},
  year = {1982},
  doi = {10.1016/s0026-2692(82)80176-6}
}

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