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article · 2023

Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

Marco Saldutti, Yi Yu, Jesper Mørk

Cited by 0Abstract and details only

Abstract

Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.

Cite this paper

APA 7

Saldutti, M., Yu, Y., & Mørk, J. (2023). Lasing Threshold in Nanolasers with Extreme Dielectric Confinement. https://doi.org/10.1109/icton59386.2023.10207455

MLA 9

Saldutti, Marco, et al. “Lasing Threshold in Nanolasers with Extreme Dielectric Confinement.” vol. 30, 2023, pp. 1–3, https://doi.org/10.1109/icton59386.2023.10207455.

Chicago

Saldutti, Marco, Yi Yu, and Jesper Mørk. 2023. “Lasing Threshold in Nanolasers with Extreme Dielectric Confinement.” https://doi.org/10.1109/icton59386.2023.10207455.

Harvard

Saldutti, M., Yu, Y. and Mørk, J. (2023) ‘Lasing Threshold in Nanolasers with Extreme Dielectric Confinement’. Available at: https://doi.org/10.1109/icton59386.2023.10207455.

BibTeX
@article{saldutti2023lasing,
  title = {{Lasing Threshold in Nanolasers with Extreme Dielectric Confinement}},
  author = {Saldutti, Marco and Yu, Yi and Mørk, Jesper},
  volume = {30},
  pages = {1--3},
  year = {2023},
  doi = {10.1109/icton59386.2023.10207455}
}

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