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book chapter · 2009

Low-Power Test Pattern Generation

Xiaoqing Wen, Seongmoon Wang

Cited by 1Abstract and details only

Abstract

The index has no abstract for this paper. The publisher’s page may have one.

Cite this paper

APA 7

Wen, X., & Wang, S. (2009). Low-Power Test Pattern Generation. https://doi.org/10.1007/978-1-4419-0928-2_3

MLA 9

Wen, Xiaoqing, and Seongmoon Wang. “Low-Power Test Pattern Generation.” 2009, pp. 65–115, https://doi.org/10.1007/978-1-4419-0928-2_3.

Chicago

Wen, Xiaoqing, and Seongmoon Wang. 2009. “Low-Power Test Pattern Generation.” https://doi.org/10.1007/978-1-4419-0928-2_3.

Harvard

Wen, X. and Wang, S. (2009) ‘Low-Power Test Pattern Generation’. Available at: https://doi.org/10.1007/978-1-4419-0928-2_3.

BibTeX
@incollection{wen2009power,
  title = {{Low-Power Test Pattern Generation}},
  author = {Wen, Xiaoqing and Wang, Seongmoon},
  pages = {65--115},
  year = {2009},
  doi = {10.1007/978-1-4419-0928-2_3}
}

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