book chapter · Frontiers in electronic testing · 2010

Circuit-Level Soft-Error Mitigation

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Abstract

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Cite this paper

Nicolaidis, M. (2010). Circuit-Level Soft-Error Mitigation. Frontiers in electronic testing, 203–252. https://doi.org/10.1007/978-1-4419-6993-4_8

MLA 9

Nicolaidis, M. “Circuit-Level Soft-Error Mitigation.” Frontiers in electronic testing, 2010, pp. 203–52, https://doi.org/10.1007/978-1-4419-6993-4_8.

Chicago

Nicolaidis, M. 2010. “Circuit-Level Soft-Error Mitigation.” Frontiers in electronic testing: 203–52. https://doi.org/10.1007/978-1-4419-6993-4_8.

Harvard

Nicolaidis, M. (2010) ‘Circuit-Level Soft-Error Mitigation’, Frontiers in electronic testing, pp. 203–252. Available at: https://doi.org/10.1007/978-1-4419-6993-4_8.

BibTeX

@incollection{nicolaidis2010circuit,
  title = {{Circuit-Level Soft-Error Mitigation}},
  author = {Nicolaidis, M.},
  booktitle = {Frontiers in electronic testing},
  pages = {203--252},
  year = {2010},
  doi = {10.1007/978-1-4419-6993-4_8}
}

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