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article · NASA Tech Briefs · 1993

Predicting Lifetimes Of CMOS ASIC's From Test Data

M. Buehler, N. Zamani, John A. Zoutendyk

Cited by 0Abstract and details only

Abstract

Concise report discusses recent developments in use of semiempirical mathematical models to predict rates of failure and operating lifetimes of complementary metal oxide/semiconductor (CMOS) application-specific integrated circuits (ASIC's). Each model represents specific mechanism of failure. Once failure mechanisms and models relevant to given ASIC chosen, adjustable parameters in models fitted to life-test data acquired from representative integrated-circuit structures on test coupons fabricated along with ASIC's. Then design parameters of ASIC's incorporated into models, and models yield lifetimes.

Cite this paper

APA 7

Buehler, M., Zamani, N., & Zoutendyk, J. A. (1993). Predicting Lifetimes Of CMOS ASIC's From Test Data. NASA Tech Briefs, 17(8).

MLA 9

Buehler, M., et al. “Predicting Lifetimes Of CMOS ASIC's From Test Data.” NASA Tech Briefs, vol. 17, no. 8, 1993.

Chicago

Buehler, M., N. Zamani, and John A. Zoutendyk. 1993. “Predicting Lifetimes Of CMOS ASIC's From Test Data.” NASA Tech Briefs 17 (8).

Harvard

Buehler, M., Zamani, N. and Zoutendyk, J.A. (1993) ‘Predicting Lifetimes Of CMOS ASIC's From Test Data’, NASA Tech Briefs, 17(8).

BibTeX
@article{buehler1993predicting,
  title = {{Predicting Lifetimes Of CMOS ASIC's From Test Data}},
  author = {Buehler, M. and Zamani, N. and Zoutendyk, John A.},
  journal = {NASA Tech Briefs},
  volume = {17},
  number = {8},
  year = {1993}
}

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