Analog Computer
Unknown · OakTrust (Texas A&M University Libraries) · 2011
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About 10,000 papers for “Analog computer”
Unknown · OakTrust (Texas A&M University Libraries) · 2011
Cited by 0
Unknown · OakTrust (Texas A&M University Libraries) · 2011
Cited by 0
Unknown · OakTrust (Texas A&M University Libraries) · 2011
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Martin H. Weik · 2000
Cited by 1
Johnson, Clarence L, 1922- · Virtual Defense Library (Ministerio de Defensa) · 1963
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Cerier, M. M., Perry, J. L., Spector, A. N. et al. · DSpace@MIT (Massachusetts Institute of Technology) · 1954
Contains reports on two research projects.
Cited by 0Open access
Woods, R. E., Scott, R. E., MacMullen, A., Jr. et al. · DSpace@MIT (Massachusetts Institute of Technology) · 1952
Contains reports on two research programs.
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Guillemin, Ernst A., Scott, R. E., Ham, J. M. · DSpace@MIT (Massachusetts Institute of Technology) · 1951
Contains reports on two research projects.
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2013
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Mathews, R. L., Woods, R. E., Cooper, P. W. et al. · DSpace@MIT (Massachusetts Institute of Technology) · 1951
Analog Computer Research
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John V. Wait · Wiley Encyclopedia of Electrical and Electronics Engineering · 1999
Abstract The sections in this article are Operational Amplifier Circuits
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Unknown · OakTrust (Texas A&M University Libraries) · 2011
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Ho, Y. C. · DSpace@MIT (Massachusetts Institute of Technology) · 1954
Contains a report on a research project.
Cited by 0Open access
Library (Trinity College) · 1960
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Bruce B. Young · Journal of the Franklin Institute · 1957
Cited by 72
Fine, S., Razi, S. · DSpace@MIT (Massachusetts Institute of Technology) · 1953
Contains reports on three research projects.
Cited by 0Open access
Koelsch, W. A., Jr., Scott, R. E., Stern, T. E. et al. · DSpace@MIT (Massachusetts Institute of Technology) · 1953
Contains reports on four research projects.
Cited by 0Open access
Ham, J. M., Fine, S., Ruddock, K. A. et al. · DSpace@MIT (Massachusetts Institute of Technology) · 1952
Contains reports on three research projects.
Cited by 0Open access
BESAG,PETER L. · Defense Technical Information Center (DTIC) · 1962
OHIO State U. Rese rch Foundation, Colu bu R RC O V LOP ME O FOR ME SURING THE PROP RTIES OF PENETRA T FLOW INSPECTION MATERIALS. Interim rept. for Apr 59-Apr 60 on The Chemistry and Physics of Materials, by R OY B. McCauley and Q UEN I Van Winkl . Mar 2, 55p. incl. illu bl 12 refs. (Contract AF 33(616)64 0, Proj. 7360) W TR >)-%<), P . ! Uncla ified report DESCRIPTORS: * on- ructive ing, Metals, Fracture (Mecha ics), Penetration Liquids, D Y Detection, T ST ET ODS Test methods were sought for evaluating the effectiven s of liqui penetrant terials used in detection of cracks or surface fl ws in solid objects. Three lines of endeavor were followed: (1) A study was made of the surface chemistry involved in the liquid penetrant method. (2) A development program wa carri out on t production of a sta dard, repro ucible crack sy e wi w ic cr ck d c io fficiencies of liquid penetrants may be evaluated. (3) A standard crack system in electroplated chromium was used to evaluate crack detection efficiencies of commercial penetrants. Measure ents were made of urface ten ion, contact angle, spreading rates on flat surfaces, and bulk vi cosity for the commercial liquid penetrants a various temperatures. Electrodeposition of Cr on a Ni base a a clo ely controlled temperature was found to yield cracked deposits of reproducible characteristic with respect to crack geometry and crack frequency. Crack depths from 20 to 140 micro-inches and crack frequencies from 30 to 144 cracks per inch were found to be suitable in evaluating the crack detection efficiences of liquid penetrants. (Author)
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Bernd Ulmann · 2017
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