ELECTRON DIFFRACTION
Elsevier eBooks · 1970
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About 10,000 papers for “Electron diffraction”
Elsevier eBooks · 1970
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Muller, John Hubert · Michigan State University Libraries · 1954
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Mohsen Asadi Asadabad, Mohammad Jafari Eskandari · InTech eBooks · 2016
Electron microscopes are usually supplied with equipment for obtaining diffraction patterns and micrographs from the same area of a specimen and the best results are attained if the complete use is to be made of these combined facilities. Electron diffraction patterns are used to obtain quantitative data including phase identification, orientation relationship and crystal defects in materials, etc. At first, a general introduction including a geometrical and quantitative approach to electron diffraction from a crystalline specimen, the reciprocal lattice and electron diffraction in the electron microscope are presented. The scattering process by an individual atom as well as a crystal, the Bragg law, Laue conditions and structure factor are also discussed. Types of diffraction patterns such as ring pattern, spot pattern and Kikuchi pattern, and general and unique indexing diffraction patterns are explained. The procedure for indexing simple, complicated and imperfect patterns as well as Kikuchi lines and a combination of Kikuchi lines and spots is outlined. The known and unknown materials are identified by indexing patterns. Practical comparisons between various methods of analysing diffraction patterns are also described. The basic diffraction patterns and the fine structure in the patterns including specimen tilting experiments, orientation relationship determination, phase identification, twinning, second phases, crystallographic information, dislocation, preferred orientation and texture, extra spots and streaks are described in detail. Finally, electron diffraction patterns of new materials are investigated.
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J. M. Cowley · digital Encyclopedia of Applied Physics · 2003
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Emily Jean Zerger, PURITY KEMUNTO BUNDI, Brant Carlson et al. · OSF Preprints (OSF Preprints)
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Montes, Nacho · Figshare · 2025
Observation of the electrons diffraction originated by polycrystalline graphite and determination, from this phenomenon, the main interplanar distances. Also obtained Planck's constant.
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Leif Henriksen · Radiation Effects · 1971
Abstract T. B. Rymer Methuen, London; Barnes and Noble, New York, 165 pages, 7 plates. £2.50
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Montes, Nacho · Figshare · 2025
Observation of the electrons diffraction originated by polycrystalline graphite and determination, from this phenomenon, the main interplanar distances. Also obtained Planck's constant.
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Gunturi Venkata Sitarama Sastry · Indian Institute of Metals series · 2022
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Van Nostrand's Encyclopedia of Chemistry · 2005
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L. I. Mirkin · 1964
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2009
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Ferkinhoff, Carl Douglas · Open Science Framework · 2016
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Brant Carlson, PURITY KEMUNTO BUNDI, Emily Jean Zerger et al. · OSF Preprints (OSF Preprints) · 2021
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Beeching,R. · Bulletin of Miscellaneous Information (Royal Gardens Kew) · 1936
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Nobuo Tanaka · 2017
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Xiaodong Zou, Sven Hovmöller, Peter Oleynikov · Oxford University Press eBooks · 2011
Electron diffraction comes from the combined scattering from many atoms arranged in a crystal. Bragg’s law and the Ewald sphere explain where the diffraction spots will fall on a detector and when the different reflections will be excited. Phase identification and zone-axis orientation is done from one or a few ED patterns. Determination of the unit-cell dimensions come from three main zone axes, high-order Laue zones (HOLZ) or a tilt series. Precession geometry is explained with ray paths and snap-shots from the collection of precession patterns in the TEM. Digital (by software) and analogue (by hardware) precession are compared. The geometrical factors that influence intensities, i.e. the Lorentz factor are given. The very latest techniques for collecting complete 3D ED data is shown, with the two existing geometries, automated diffraction tomography and the rotation method. Convergent-beam electron diffraction (CBED) is briefly introduced.
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1993
Abstract Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
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H. Tinsley and Co Ltd. · Journal of Scientific Instruments · 1960
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Stef Smeets, A Lynne B. Mccusker, A Christian Baerlocher et al. · 2013
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