Strong embedding and weak embedding
Tuna Altınel, Alexandre Borovik, Gregory Cherlin · Mathematical surveys and monographs · 2008
Cited by 0
Read the abstract, see who wrote it and who cites it, and get the citation in APA, MLA, Chicago or Harvard.
About 10,000 papers for “Embedding”
Tuna Altınel, Alexandre Borovik, Gregory Cherlin · Mathematical surveys and monographs · 2008
Cited by 0
Całek, Agnieszka · Jagiellonian University Repository (Jagiellonian University) · 2024
Cited by 0Open access
Spinzi, Cinzia Giacinta · AMS Campus - AlmaDL · 2012
Cited by 0
C.P. Wong, Jianwen Xu · Kirk-Othmer Encyclopedia of Chemical Technology · 2004
Abstract Advances in electronic technology have had great technological and economic impact on the electronic industry throughout the world. The rapid growth of the number of components per chip, the rapid decrease of device dimension, and the steady increase in IC chip size have imposed stringent requirements not only on IC physical design and fabrication, but also in electronic packaging and embedding. Electronic embedding is one of the most common processes used to encapsulate and protect electronic components. With advances in VLSI technology and multichip modules packaging, embedding of high density packages in electronics has become a challenge. Various polymeric encapsulants are used for embedding these types of electronic components. These materials, such as silicones, silicon‐carbon thermosets, epoxies, polyurethanes, polyesters, polysulfides, and advanced thermoplastics, and their electrical, mechanical, and rheological properties as well as material processes related to molding, potting, casting, and saturation coating processes, are discussed in detail. Furthermore the studies of material curing by differential calorimetry, ftir, and microdielectrometry are described. The development of a novel aluminum‐filled high dielectric composite is detached. Aluminum is a fast self‐passivation and low‐cost metal. The thin passivation layer forms a boundary layer outside of metallic spheres that has dramatic effects on the electrical, mechanical, and chemical behaviors of the resulting composites.
Cited by 0
2015
Cited by 0
Encyclopedic Dictionary of Genetics, Genomics and Proteomics · 2004
Cited by 0
Tuấn Đạt · Kaggle · 2024
Cited by 0Open access
Claudia Pons, La Plata · 2008
Cited by 0
Katsushi Ikeuchi · 2021
Cited by 0
The MIT Press eBooks · 2002
Cited by 0
Klaus Solberg Söilen · Springer texts in business and economics · 2024
Cited by 0
Thiel, W. · Max Planck Digital Library · 1998
Cited by 0
National Cancer Institute · Definitions · 2020
Ope n Pe e r Re v ie w on Qe ios Ope n Pe e r Re v ie
Cited by 0Open access
Thiel, W. · MPG.PuRe (Max Planck Society) · 1998
Cited by 0
Robert Tagliaferro, Brandon Possum, Steven Wilson et al. · 2024
Cited by 0
2015
Cited by 0
C. P. Wong, Paul D'Ambra · Kirk-Othmer Encyclopedia of Chemical Technology · 2000
Abstract Advances in electronic technology have had great technological and economic impact on the electronic industry throughout the world. The rapid growth of the number of components per chip, the rapid decrease of device dimension, and the steady increase in IC chip size have imposed stringent requirements not only on IC physical design and fabrication, but also in electronic packaging and embedding. Electronic embedding is one of the most common processes used to encapsulate and protect electronic components. With advances in VLSI technology and multichip modules packaging, embedding of high density packages in electronics has become a challenge. Various polymeric encapsulants are used for embedding these types of electronic components. These materials, such as silicones, silicon‐carbon thermosets, epoxies, polyurethanes, polyesters, polysulfides, and advanced thermoplastics, and their electrical, mechanical, and rheological properties as well as material processes related to molding, potting, casting, and saturaton coating processes, are discussed in detail. Furthermore the studies of material curing by differential calorimetry, ftir, and microdielectrometry are described.
Cited by 0
Inoue · Zenodo (CERN European Organization for Nuclear Research) · 2025
Cited by 0Open access
2012
Cited by 0
Tom Lancaster, Stephen J. Blundell · 2025
Cited by 0