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About 10,000 papers for “critical path method”

Horticultural management - Critical Path Method

Stevens, R.B. · Lincoln University Research Archive (Lincoln University) · 1982

pagination errors/missing pages - page 15 & 16, 55 & 56. Unclear date of publication, estimated 1982

Cited by 0

10. Critical Path Method (CPM)

Arashpour, Mehrdad · Figshare · 2021

This short video provides a brief overview of project scheduling using Critical Path Method (CPM). In particular, the following issues are discussed: · Network representations: Activity on Node (AoN) & Activity on Arrow (AoA) · Earliest time for activities (Te) · Latest time for activities (Tl)

Cited by 0Open access

10. Critical Path Method (CPM)

Arashpour, Mehrdad · Figshare · 2021

This short video provides a brief overview of project scheduling using Critical Path Method (CPM). In particular, the following issues are discussed: · Network representations: Activity on Node (AoN) & Activity on Arrow (AoA) · Earliest time for activities (Te) · Latest time for activities (Tl)

Cited by 0Open access

Fuzzy durations in critical path method

S.H. Nasution · 2002

The previous application of fuzzy members to the critical path method, as is known from literature, provides only the earliest expected time for each event of the project. The author shows that a further extension can be made by considering interactive fuzzy subtraction and by observing that only the positive part of the fuzzy numbers can have a physical interpretation. Based on these two observations, the formulas for latest allowable time and slack for each event are given. The possible critical paths in the network model of the project can then be identified. An indicator of degree of involvement of an event in the critical path is introduced, followed by an example.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Cited by 8

AN IMPROVEMENT OF CRITICAL PATH METHOD

Lin X · 1984

The Critical Path Method, a method used for generating test patterns for digital circuits, is analysed and improved with a transitional expanding method. This improved method can find out all test patterns for those combinational circuits which meet two conditions given in this paper. It has been also shown that the desensitive path is the only cause of nonuniform testabilities of fan-out lines and fan-out sources. A label method to recognize the testability of fan-out source is presented. The improved method has been programmed and some results are given.

Cited by 1