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About 10,000 papers for “surface analysis”

Surface Analysis

Chan, Chi Ming · Rare & Special e-Zone (The Hong Kong University of Science and Technology) · 1991

Cited by 0

Surface Analysis

D. Briggs · Encyclopedia of Polymer Science and Technology · 2004

Abstract The surface properties of polymers are important in many applications and they are dependent on the structure and composition of the outermost molecular layers. The surface layer thickness involved is typically of the order of a few nanometers. Understanding surface structure–property relationships therefore requires analytical techniques which have this degree of surface sensitivity (or specificity). Two techniques stand out: X‐ray photoelectron spectroscopy (XPS), also known as ESCA (electron spectroscopy for chemical analysis), and secondary ion mass spectrometry (SIMS). The information provided by these methods is highly complementary and they are frequently used in combination. This article describes the physical bases and analytical capabilities of XPS and SIMS and illustrates their application in polymer surface characterization.

Cited by 0

Surface Analysis

Not Available · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 2006

In the Surface Analysis group, within the National Center for Photovoltaic's Measurements and Characterization Division, we use surface analytical techniques help to determine the chemical, elemental, and molecular composition, and electronic structure of material surfaces and interfaces. The properties of the surface and outer few micrometers of a material often control the electrical, chemical, or mechanical properties of that material--hence, this region is of extreme importance. Our techniques use ions, electrons, and X-ray or ultraviolet photons in high vacuum to probe surfaces and interfaces of a material. We map the elemental and chemical composition of specimens, study impurities and grain boundaries, gather bonding and chemical-state information, measure surface electronic properties, and perform depth profiles to determine doping and elemental distributions. We have analyzed a wide range of materials, including photovoltaics, microelectronics, polymers, and biological specimens. We work collaboratively with you to solve materials- and device-related R&D problems. This sheet describes our major technique capabilities.

Cited by 0Open access

Surface Analysis

八田 珠郎 · Nippon Shokuhin Kagaku Kogaku Kaishi · 1997

Cited by 0Open access

Surface Analysis

Thomas J. Bruno, J. W. Robinson, Eileen M. Skelly Frame et al. · 2023

Surface analysis has become increasingly important because our understanding of the behavior of materials has grown. The various surface analysis methods reveal the elements present, the distribution of the elements, and sometimes the chemical forms of the elements in a surface layer. A number of techniques have been developed for surface analysis but only the most common will be discussed in this chapter. The student should be aware that there is another class of surface analysis instruments based on analytical microscopy, including scanning electron microscopy, transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. The phenomenon is therefore confined to a few atomic layers, combined or otherwise, which are at the surface of the sample, and provides a method of surface analysis.

Cited by 0

Surface Analysis

2021

Instrumentation for chemistry always seems to develop at a robust pace, and two techniques that have, in recent years, had a notable impact on the study of adhesion are X-ray photoelectron spectroscopy and secondary-ion mass spectrometry (SIMS). Infrared spectrophotometry in reflectance modes has been available for a longer time, and has been made more useful by the arrival of Fourier transform instruments. Very highly resolved images of surfaces can be obtained using atomic force microscopy.

Cited by 0

Surface Analysis

Lu-Tao Weng, Chi-Ming Chan · Rare & Special e-Zone (The Hong Kong University of Science and Technology) · 2011

Cited by 0

Fermi surface analysis using surface methods

E. G. Michel · Journal of Physics Condensed Matter · 2007

The Fermi surface of a crystalline solid represents a paradigm of quantum solid state physics: its shape is dictated by quantum mechanics, by the Fermi–Dirac statistics for electrons and by the character of Bloch states in solids. Most physical observables depend in one or other way on the shape of the Fermi surface. Due these reasons, the Fermi surface of solids has been investigated since more than 50 years using different techniques, the most important ones being the de Haas-van Alphen effect and Compton scattering. These techniques probe very precisely the Fermi surface of crystalline solids, but surface sensitive techniques are advantageous whenever no large single-crystalline samples are available, if the Brillouin zone is small or if the surface is significantly modified. In the case of low-dimensional materials, only surface sensitive techniques can be used to analyze the Fermi surface. Angle-resolved photoemission is the most powerful surface technique able to probe the Fermi surface of a solid or a surface. Also scanning tunnelling microscopy provides information on the Fermi surface, under favourable conditions.

Cited by 0Open access

Practical Surface Analysis

Briggs, D. editor, Islamis History, Physics et al. · Andalas University Repository (Andalas University) · 1990

Cited by 229

Surface Analysis Laboratory.

Brumbach, Michael T · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 2020

Abstract not provided.

Cited by 0Open access

Surface Analysis II

R. Russell Rhinehart · ASME Press eBooks · 2018

Modifying objective functions, in general, does not make the optimization solution faster, but it can have advantages in visualizing the surface, in seeing issues, in scaling it for presentation, or in simplifying a calculation. If you modify the OF, however, you need to ensure that your modification does not change the DV* solution.

Cited by 0

Near surface analysis

Gordon Johnson · NASA Technical Reports Server (NASA) · 1993

This is a study to assist in the understanding of earth near surface structure. Higher order moments are used to detect the density distribution as well as to seek patterns found in geological structures. It is shown how higher order moments at points outside a mass structure are determined as well as how to recover the mass distribution from the higher order moments. It is interesting to note that the first moment at a point P outside the mass structure, V(sub O)(P), is the entire mass and the second moment, V(sub 1)(P), is the potential at P due to the mass structure. Usually only the mass and the potential function are used to determine the density distribution in a body. An infinite function sequence (V(sub n)(P))(sub n=0)(sup infinity) is required to uniquely determine the density distribution.

Cited by 0Open access