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book chapter · 2001

Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique

Kristof Croes, Jean Manca, W. De Ceuninck, L. De Schepper, L. Tielemans

Cited by 4Abstract and details only

Abstract

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Cite this paper

APA 7

Croes, K., Manca, J., De Ceuninck, W., De Schepper, L., & Tielemans, L. (2001). Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique. https://doi.org/10.1007/978-1-4615-1215-8_32

MLA 9

Croes, Kristof, et al. “Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique.” 2001, pp. 291–96, https://doi.org/10.1007/978-1-4615-1215-8_32.

Chicago

Croes, Kristof, Jean Manca, W. De Ceuninck, L. De Schepper, and L. Tielemans. 2001. “Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique.” https://doi.org/10.1007/978-1-4615-1215-8_32.

Harvard

Croes, K. et al. (2001) ‘Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique’. Available at: https://doi.org/10.1007/978-1-4615-1215-8_32.

BibTeX
@incollection{croes2001ageing,
  title = {{Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique}},
  author = {Croes, Kristof and Manca, Jean and De Ceuninck, W. and De Schepper, L. and Tielemans, L.},
  pages = {291--296},
  year = {2001},
  doi = {10.1007/978-1-4615-1215-8_32}
}

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