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article · 2002

A nonenumerative ATPG for functionally sensitizable path delay faults

Dimitrios Karayiannis, Spyros Tragoudas

Cited by 4Abstract and details only

Abstract

This paper presents a test pattern generator for path delay faults which generates a polynomial number of test patterns that target a large number of functionally sensitizable faults. The number of these faults may be exponential to the input site. Experimental results are presented on the ISCAS'85 benchmarks.

Cite this paper

APA 7

Karayiannis, D., & Tragoudas, S. (2002). A nonenumerative ATPG for functionally sensitizable path delay faults. https://doi.org/10.1109/vtest.1998.670908

MLA 9

Karayiannis, Dimitrios, and Spyros Tragoudas. “A nonenumerative ATPG for functionally sensitizable path delay faults.” 2002, pp. 440–45, https://doi.org/10.1109/vtest.1998.670908.

Chicago

Karayiannis, Dimitrios, and Spyros Tragoudas. 2002. “A nonenumerative ATPG for functionally sensitizable path delay faults.” https://doi.org/10.1109/vtest.1998.670908.

Harvard

Karayiannis, D. and Tragoudas, S. (2002) ‘A nonenumerative ATPG for functionally sensitizable path delay faults’. Available at: https://doi.org/10.1109/vtest.1998.670908.

BibTeX
@article{karayiannis2002nonenumerative,
  title = {{A nonenumerative ATPG for functionally sensitizable path delay faults}},
  author = {Karayiannis, Dimitrios and Tragoudas, Spyros},
  pages = {440--445},
  year = {2002},
  doi = {10.1109/vtest.1998.670908}
}

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