article · Microelectronics Reliability · 1991

A stuck fault model for dynamic CMOS combinational circuits

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Abstract

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Cite this paper

Ismaeel, A. A. (1991). A stuck fault model for dynamic CMOS combinational circuits. Microelectronics Reliability, 31(2-3), 407–427. https://doi.org/10.1016/0026-2714(91)90228-y

MLA 9

Ismaeel, Asad A. “A stuck fault model for dynamic CMOS combinational circuits.” Microelectronics Reliability, vol. 31, no. 2-3, 1991, pp. 407–27, https://doi.org/10.1016/0026-2714(91)90228-y.

Chicago

Ismaeel, Asad A. 1991. “A stuck fault model for dynamic CMOS combinational circuits.” Microelectronics Reliability 31 (2-3): 407–27. https://doi.org/10.1016/0026-2714(91)90228-y.

Harvard

Ismaeel, A.A. (1991) ‘A stuck fault model for dynamic CMOS combinational circuits’, Microelectronics Reliability, 31(2-3), pp. 407–427. Available at: https://doi.org/10.1016/0026-2714(91)90228-y.

BibTeX

@article{ismaeel1991stuck,
  title = {{A stuck fault model for dynamic CMOS combinational circuits}},
  author = {Ismaeel, Asad A.},
  journal = {Microelectronics Reliability},
  volume = {31},
  number = {2-3},
  pages = {407--427},
  year = {1991},
  doi = {10.1016/0026-2714(91)90228-y}
}

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