Test for detection and location of intermittent faults in combinational circuits
Asad A. Ismaeel, R. Bhatnagar · IEEE Transactions on Reliability · 1997
Cited by 60
Author · Kuwait University
Asad A. Ismaeel
- Works
- 29
- Cited by
- 164
- h-index
- 7
Most-cited papers
The probability of error detection in sequential circuits using random test vectors
Asad A. Ismaeel, Melvin A. Breuer · Journal of Electronic Testing · 1991
Cited by 24
Assignment and allocation of highly testable data paths under scan optimization
Asad A. Ismaeel, M.K. Dhodhi, Rajan Mathew · Integration · 1996
Cited by 9
High-level synthesis of data paths for easy testability
M.K. Dhodhi, Imtiaz Ahmad, Asad A. Ismaeel · IEE Proceedings - Circuits Devices and Systems · 1995
Cited by 9
Modification of scheduled data flow graph for on-line testability
Asad A. Ismaeel, R. Bhatnagar, R. Mathew · Microelectronics Reliability · 1999
Cited by 8
A transistor fault model for nMOS combinational circuits
Asad A. Ismaeel · Microelectronics Journal · 1991
Cited by 8
Testing for stuck faults in CMOS combinational circuits
Asad A. Ismaeel · IEE Proceedings G Circuits Devices and Systems · 1991
Cited by 7
A stuck fault model for dynamic CMOS combinational circuits
Asad A. Ismaeel · Microelectronics Reliability · 1991
Cited by 7
Testing multiple-output CMOS combinational circuits
Asad A. Ismaeel · International Journal of Electronics · 1989
Cited by 5
Concurrent testing in high level synthesis
Asad A. Ismaeel, R. Bhatnagar, R. Mathew · Microelectronics Reliability · 2000
Cited by 4
Data path synthesis for easy testability
M.K. Dhodhi, Imtiaz Ahmad, Asad A. Ismaeel · Proceedings - Asian Test Symposium/Proceedings · 2002
Cited by 3
Module allocation for on-line testing
Asad A. Ismaeel, R. Mathew, R Bhatnagar · Microelectronics Reliability · 2000
Cited by 3
Stuck fault test generation for dynamic CMOS
Asad A. Ismaeel · Microelectronics Reliability · 1994
Cited by 3
Module allocation with idle-time utilization for on-line testability
Asad A. Ismaeel, R. Mathew, R. Bhatnagar · Microelectronics Reliability · 2001
Cited by 2
Scheduling and variable binding for improved testability in high level synthesis
Asad A. Ismaeel, R. Mathew, R. Bhatnagar · Computers & Electrical Engineering · 1998
Cited by 2