article · Microelectronics Reliability · 2001

Module allocation with idle-time utilization for on-line testability

Asad A. Ismaeel, R. Mathew, Rakesh Bhatnagar

Cited by 2Abstract and details only

Abstract

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Cite this paper

Ismaeel, A. A., Mathew, R., & Bhatnagar, R. (2001). Module allocation with idle-time utilization for on-line testability. Microelectronics Reliability, 41(2), 323–332. https://doi.org/10.1016/s0026-2714(00)00078-0

MLA 9

Ismaeel, Asad A., et al. “Module allocation with idle-time utilization for on-line testability.” Microelectronics Reliability, vol. 41, no. 2, 2001, pp. 323–32, https://doi.org/10.1016/s0026-2714(00)00078-0.

Chicago

Ismaeel, Asad A., R. Mathew, and Rakesh Bhatnagar. 2001. “Module allocation with idle-time utilization for on-line testability.” Microelectronics Reliability 41 (2): 323–32. https://doi.org/10.1016/s0026-2714(00)00078-0.

Harvard

Ismaeel, A.A., Mathew, R. and Bhatnagar, R. (2001) ‘Module allocation with idle-time utilization for on-line testability’, Microelectronics Reliability, 41(2), pp. 323–332. Available at: https://doi.org/10.1016/s0026-2714(00)00078-0.

BibTeX

@article{ismaeel2001module,
  title = {{Module allocation with idle-time utilization for on-line testability}},
  author = {Ismaeel, Asad A. and Mathew, R. and Bhatnagar, Rakesh},
  journal = {Microelectronics Reliability},
  volume = {41},
  number = {2},
  pages = {323--332},
  year = {2001},
  doi = {10.1016/s0026-2714(00)00078-0}
}

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