Skip to content
Free planNo credit card requiredStart writing
AI for Research home
AI for Research home
Dashboard
Sign inGet started

conference paper · IEEE International Test Conference (ITC) · 2002

Simulation of non-classical faults on the gate level - The fault simulator COMSIM

U. Mahlstedt, J. Alt

Cited by 19Abstract and details only

Abstract

COMSIM is a fault simulator for combinational circuits which can efficiently handle various gate level fault models. Stuck-at faults, function conversions, bridging faults, transition faults as well as multiple faults of all types and faults with additional fault detection conditions, can be simulated in one pass. This offers a practical approach to solve the conflict between the accuracy of fault modeling, which usually requires a low level circuit description, and the desired performance of the simulation tools, which forbids the use of a low level description. In a preprocessing step which has to be performed only once for a given cell library, the effects of realistic faults are investigated for each gate type. These fault effects are mapped onto gate level faults and stored in a fault library. The specification of a corresponding gate level fault is almost always possible due to the wide variety of gate level fault models which can be simulated by COMSIM. Simulation results are given which demonstrate the practicability and the advantages of library-based fault modeling. The experimental results show that COMSIM can efficiently handle non-classical faults on the gate level.>

Cite this paper

APA 7

Mahlstedt, U., & Alt, J. (2002). Simulation of non-classical faults on the gate level - The fault simulator COMSIM. IEEE International Test Conference (ITC), 883–892. https://doi.org/10.1109/test.1993.470612

MLA 9

Mahlstedt, U., and J. Alt. “Simulation of non-classical faults on the gate level - The fault simulator COMSIM.” IEEE International Test Conference (ITC), 2002, pp. 883–92, https://doi.org/10.1109/test.1993.470612.

Chicago

Mahlstedt, U., and J. Alt. 2002. “Simulation of non-classical faults on the gate level - The fault simulator COMSIM.” IEEE International Test Conference (ITC): 883–92. https://doi.org/10.1109/test.1993.470612.

Harvard

Mahlstedt, U. and Alt, J. (2002) ‘Simulation of non-classical faults on the gate level - The fault simulator COMSIM’, IEEE International Test Conference (ITC), pp. 883–892. Available at: https://doi.org/10.1109/test.1993.470612.

BibTeX
@article{mahlstedt2002simulation,
  title = {{Simulation of non-classical faults on the gate level - The fault simulator COMSIM}},
  author = {Mahlstedt, U. and Alt, J.},
  journal = {IEEE International Test Conference (ITC)},
  pages = {883--892},
  year = {2002},
  doi = {10.1109/test.1993.470612}
}

Made from the index record. Check names, capitalisation and page numbers against the paper. Need another style? AI for Research has over 10,000.

Related papers