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article · Microelectronics Reliability · 1997

Symbolic fault modelling of MOS combinational circuits

Predrag M. Petković, D. Milovanovic, Vanco B. Litovski

Cited by 5Abstract and details only

Abstract

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APA 7

Petković, P. M., Milovanovic, D., & Litovski, V. B. (1997). Symbolic fault modelling of MOS combinational circuits. Microelectronics Reliability, 37(1), 137–157. https://doi.org/10.1016/0026-2714(95)00245-6

MLA 9

Petković, Predrag M., et al. “Symbolic fault modelling of MOS combinational circuits.” Microelectronics Reliability, vol. 37, no. 1, 1997, pp. 137–57, https://doi.org/10.1016/0026-2714(95)00245-6.

Chicago

Petković, Predrag M., D. Milovanovic, and Vanco B. Litovski. 1997. “Symbolic fault modelling of MOS combinational circuits.” Microelectronics Reliability 37 (1): 137–57. https://doi.org/10.1016/0026-2714(95)00245-6.

Harvard

Petković, P.M., Milovanovic, D. and Litovski, V.B. (1997) ‘Symbolic fault modelling of MOS combinational circuits’, Microelectronics Reliability, 37(1), pp. 137–157. Available at: https://doi.org/10.1016/0026-2714(95)00245-6.

BibTeX
@article{petkovic1997symbolic,
  title = {{Symbolic fault modelling of MOS combinational circuits}},
  author = {Petković, Predrag M. and Milovanovic, D. and Litovski, Vanco B.},
  journal = {Microelectronics Reliability},
  volume = {37},
  number = {1},
  pages = {137--157},
  year = {1997},
  doi = {10.1016/0026-2714(95)00245-6}
}

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