article · 2002

Current testing

Cited by 8Abstract and details only

Abstract

Summary form only given. It is pointed out that current testing is and will increasingly become attractive as a main technique for testing static CMOS circuits. BIC (built-in current) testing can provide testing qualities achievable with other testing techniques. It is suggested that future testing approaches geared toward high-quality and/or reliability-oriented testing procedures will be formed using a combination of voltage and current testing methodologies.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

Cite this paper

APA 7

Maly, W. (2002). Current testing. https://doi.org/10.1109/test.1990.114027

MLA 9

Maly, W. “Current testing.” 2002, p. 257, https://doi.org/10.1109/test.1990.114027.

Chicago

Maly, W. 2002. “Current testing.” https://doi.org/10.1109/test.1990.114027.

Harvard

Maly, W. (2002) ‘Current testing’. Available at: https://doi.org/10.1109/test.1990.114027.

BibTeX

@article{maly2002current,
  title = {{Current testing}},
  author = {Maly, W.},
  pages = {257},
  year = {2002},
  doi = {10.1109/test.1990.114027}
}

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