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article · IEEE Transactions on Industrial Electronics · 1989

Microprocessor testability

H. Troy Nagle, R.R. Fritzemeier, J.E. Van Well, M.G. McNamer

Cited by 6Abstract and details only

Abstract

As the level of microprocessor complexity increases to several hundred thousand transistors for a single-chip machine, it is becoming very difficult to test commercially available designs to the level of fault coverage desired by some customers. In order to achieve near 100-percent coverage of single stuck-at faults, future microprocessors must be designed with special testing features (designed for testability). The authors describe the testing problem for microprocessors, including the various methods of generating test sets and their application by the user. A survey of the testability features of some of today's commercially available microprocessors is presented. Suggestions for testability features for future-generation microprocessors are also discussed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Cite this paper

APA 7

Nagle, H. T., Fritzemeier, R., Van Well, J., & McNamer, M. (1989). Microprocessor testability. IEEE Transactions on Industrial Electronics, 36(2), 151–163. https://doi.org/10.1109/41.19064

MLA 9

Nagle, H. Troy, et al. “Microprocessor testability.” IEEE Transactions on Industrial Electronics, vol. 36, no. 2, 1989, pp. 151–63, https://doi.org/10.1109/41.19064.

Chicago

Nagle, H. Troy, R.R. Fritzemeier, J.E. Van Well, and M.G. McNamer. 1989. “Microprocessor testability.” IEEE Transactions on Industrial Electronics 36 (2): 151–63. https://doi.org/10.1109/41.19064.

Harvard

Nagle, H.T. et al. (1989) ‘Microprocessor testability’, IEEE Transactions on Industrial Electronics, 36(2), pp. 151–163. Available at: https://doi.org/10.1109/41.19064.

BibTeX
@article{nagle1989microprocessor,
  title = {{Microprocessor testability}},
  author = {Nagle, H. Troy and Fritzemeier, R.R. and Van Well, J.E. and McNamer, M.G.},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {36},
  number = {2},
  pages = {151--163},
  year = {1989},
  doi = {10.1109/41.19064}
}

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