book chapter · Kluwer international series in engineering and computer science · 1990

Test Generation for Dynamic CMOS Circuits

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Abstract

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Cite this paper

Jha, N. K., & Kundu, S. (1990). Test Generation for Dynamic CMOS Circuits. Kluwer international series in engineering and computer science, 43–85. https://doi.org/10.1007/978-1-4613-1525-4_3

MLA 9

Jha, Niraj K., and Sandip Kundu. “Test Generation for Dynamic CMOS Circuits.” Kluwer international series in engineering and computer science, 1990, pp. 43–85, https://doi.org/10.1007/978-1-4613-1525-4_3.

Chicago

Jha, Niraj K., and Sandip Kundu. 1990. “Test Generation for Dynamic CMOS Circuits.” Kluwer international series in engineering and computer science: 43–85. https://doi.org/10.1007/978-1-4613-1525-4_3.

Harvard

Jha, N.K. and Kundu, S. (1990) ‘Test Generation for Dynamic CMOS Circuits’, Kluwer international series in engineering and computer science, pp. 43–85. Available at: https://doi.org/10.1007/978-1-4613-1525-4_3.

BibTeX

@incollection{jha1990test,
  title = {{Test Generation for Dynamic CMOS Circuits}},
  author = {Jha, Niraj K. and Kundu, Sandip},
  booktitle = {Kluwer international series in engineering and computer science},
  pages = {43--85},
  year = {1990},
  doi = {10.1007/978-1-4613-1525-4_3}
}

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