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conference paper · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1988

Acoustic Microscopy

Butrus T. Khuri-Yakub

Cited by 1Abstract and details only

Abstract

Acoustic microscopy has been growing steadily since the development of the first microscope in the mid-seventies. Since that date, acoustic microscopes have been used as both qualitative tools for imaging, and quantitative tools for the characterization of materials. The frequency range, and thus resolution, of acoustic microscopes covers several decades which makes the methodology useful for examining materials with spatial resolutions ranging from millimeters to Angstroms. In this paper, we will review the principle of operation of the microscope, show some imaging results, and present some quantitative measurements of samples using both amplitude only and amplitude and phase measuring microscopes. We will also show some recent results of quantitative measurements of anisotropy and surface residual stress that are possible with new types of lenses.

Cite this paper

APA 7

Khuri-Yakub, B. T. (1988). Acoustic Microscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 0897, 118. https://doi.org/10.1117/12.944528

MLA 9

Khuri-Yakub, Butrus T. “Acoustic Microscopy.” Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, vol. 0897, 1988, p. 118, https://doi.org/10.1117/12.944528.

Chicago

Khuri-Yakub, Butrus T. 1988. “Acoustic Microscopy.” Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 0897: 118. https://doi.org/10.1117/12.944528.

Harvard

Khuri-Yakub, B.T. (1988) ‘Acoustic Microscopy’, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 0897, p. 118. Available at: https://doi.org/10.1117/12.944528.

BibTeX
@article{khuriyakub1988acoustic,
  title = {{Acoustic Microscopy}},
  author = {Khuri-Yakub, Butrus T.},
  journal = {Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE},
  volume = {0897},
  pages = {118},
  year = {1988},
  doi = {10.1117/12.944528}
}

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