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About 10,000 papers for “multiple faults”

Multiple Faults Fuzzy Detection . . .

Imtiez Fliss, Moncef Tagina · 2010

In this paper an on-line multiple faults detection approach is proposed and improved by the use of Particle Swarm Optimization (PSO) to optimally adjust the membership functions parameters. The residuals obtained by Analytical Redundancy Relations are used as inputs to our system. The Analytical Redundancy Relations are generated by the use of bond graph modelling. The results of the fuzzy detection module are presented as a colored causal graph. The causal graph represents the state of different variables from the green nominal state to the red faulty state. The proposed approaches are then tested through a simulation of the three-tank hydraulic system. A comparison between the results obtained by using PSO and those given by the use of Genetic Algorithms (GA) is finally made.

Cited by 0

On multiple bridging faults

Irith Pomeranz, S.M. Reddy · 2010

Multiple faults are typically detected by test sets for single faults. For bridging faults, we show that fault activation conditions are more difficult to create for certain multiple faults than for the single faults that comprise them. As a result, a test set for single bridging faults may leave significant percentages of detectable multiple faults undetected. We discuss three such cases, corresponding to three types of bridging faults, and present experimental results for one of them. As part of this study we consider the ability of a 10-detection test set for single stuck-at faults to detect multiple bridging faults of this type.

Cited by 3

RAIM with Multiple Faults

John E. Angus · NAVIGATION Journal of the Institute of Navigation · 2006

ABSTRACT: Contemporary Receiver Autonomous Integrity Monitoring (RAIM) algorithms such as that developed by Brown and Chin [1] are designed to allow the user's receiver to supply its own integrity and protect against the development of excessive noise as well as bias, both originating from the ranging measurements. Past RAIM protection levels have assumed that there is at most one ranging source with bias. This work is focused on extending RAIM protection levels to account for multiple biases.

Cited by 106

Diagnosis of multiple bus faults

J.J. Narraway · IEE Proceedings E Computers and Digital Techniques · 1989

A method is described for the identification of sticking bits on a data transmission bus. The method is probabilistic in nature and can use on-line bus data. It is also suitable for use against intermittent faults. Exact and useful approximate analyses are given for various diagnostic procedures using overall bus data words and compartmentalised bus data words. Numerical performance data are given for each procedure.

Cited by 4

Protection against multiple memory faults

Е.С. Лепёшкина · Modelirovanie, optimizaciâ i informacionnye tehnologii. · 2024

Рассмотрена проблема множественных сбоев, образующихся в микросхемах памяти бортовой аппаратуры космических аппаратов в результате воздействия отдельных ядерных частиц космического пространства. Обзор литературных источников показал, что опасность множественных сбоев реальна и будет увеличиваться по мере уменьшения технологических норм проектирования электронной компонентной базы. Двойные множественные сбои являются в настоящее время наиболее актуальной угрозой, так как их появление вызвано заряженными частицами с относительно небольшой энергией. Двойные сбои могут быть смежными и несмежными. Смежные двойные сбои вызваны одномоментным действием одной ядерной частицы. Несмежные сбои – это результат накопления однократных сбоев, произошедших в разное время в разных запоминающих ячеек одного слова памяти. При определенных условиях можно избежать появление двукратных несмежных ошибок. Для защиты от двойных смежных ошибок применимы коды для их исправления. Эти коды являются относительно новыми и обобщённое описание их построения отсутствует. Данные коды гарантировано исправляют однократные ошибки и двукратные смежные, но имеют существенную вероятность ошибочного исправления несмежной двойной ошибки. При переходе к практическому использованию для этих кодов необходимо определить требования к виду проверочной матрицы, найти общий алгоритм их построения для разной длины слова памяти при малой избыточности и высокой производительности при условии, что к корректирующим способностям кода предъявляются требования обнаружения и исправления только одиночных и двойных смежных ошибок и никаких дополнительных. The problem of multiple faults in the memory chips of on-board equipment of spacecraft as a result of the impact of individual nuclear particles in outer space is considered. A review of the literature showed that the danger of multiple failures is real and will increase as technological standards for the design of electronic components decrease. Double multiple faults are currently the most pressing threat, as they are caused by charged particles with relatively low energies. Double faults can be adjacent or non-adjacent. Adjacent double faults are caused by the simultaneous action of a single nuclear particle. Non-adjacent faults are the result of the accumulation of single failures that occurred at different times in different storage cells of the same memory word. Under certain conditions, the occurrence of double non-contiguous errors can be avoided. To protect against double adjacent errors, correcting codes are used. These codes are relatively new and there is no general description of their construction. These codes are guaranteed to correct single errors and double adjacent errors, but have a significant probability of erroneously correcting a non-adjacent double error. But when moving to practical use, it is necessary to determine the requirements for the type of check matrix for these codes, to find a general algorithm for their construction for different memory word lengths, with low redundancy and high performance, provided that the correcting abilities of the code are subject to the requirements of detecting and correcting only single and double adjacent errors and no additional ones.

Cited by 0Open access

Testing trees for multiple faults

Anastasios Vergis, C. Tobon · 2002

A "well behaving" property is defined for each line (in general a bundle of wires) connecting two combinational logic cells. This property can be easily taken into account in the design process of the circuit. It is shown that all tree-structured circuits of combinational logic cells are easily testable for multiple faults if each line is "well behaving". The size of the test set increases only linearly as the number of cells increases. It is also shown that if no line is well-behaving then only the trivial (exhaustive) test set exists for the circuit, which increases exponentially as the number of cells increases. If there are well-behaving as well as non-well-behaving lines in the circuit, then the size of the test set increases exponentially with the sizes of the non-well-behaving subtrees and linearly with the number of such subtrees.

Cited by 0

Multiple bridging faults in monotone networks

A. Vogel · IEE Journal on Computers and Digital Techniques · 1978

Multiple bridging faults in monotone networks (networks with out negations) are investigated. Complete test sets of monotone networks for single and multiple bridging faults are constructed. It is shown that the test complexity of fanout free monotone networks for the class of multiple bridging faults has an upper bound that is seen to be linear in the number of network input lines. For monotone networks, the paper shows how to carry over Aker's method for generating universal test sets for stuck-at faults to the bridging faults as well.

Cited by 0

ARTIFICIAL INTELLIGENCE 97 Diagnosing Multiple Faults

Johan De Kleer, Brian C. Williams · 2008

Diagnostic tasks require determining the differences between a model of an artifact and the artifact itself. The differences between the manifested behavior of the artifact and the predicted behavior of the model guide the search for the differences between the artifact and its model. The diagnostic procedure presented in this paper is model-based, inferring the behavior of the composite device from knowledge of the structure and function of the individual components comprising the device. The system (GDE—general diagnostic engine) has been implemented and tested on many examples in the domain of troubleshooting digital circuits. This research makes several novel contributions: First, the system diagnoses failures due to multiple faults. Second, failure candidates are represented and manipulated in terms of minimal sets of violated assumptions, resulting in an efficient diagnostic procedure. Third, the diagnostic procedure is incremental, exploiting the iterative nature of diagnosis. Fourth, a clear separation is drawn between diagnosis and behavior prediction, resulting in a domain (and inference procedure) independent diagnostic procedure. Fifth, GDE combines model-based prediction with sequential diagnosis to propose measurements to localize the faults. The normally required conditional probabilities are computed from the structure of the device and models of its components. This capability results from a novel way of incorporating probabilities and information theory into the context mechanism provided by assumption-based truth maintenance. 1.

Cited by 0

DCA Based Multiple Faults Diagnosis Method

Funa Zhou, Chenglin Wen, Tianhao Tang et al. · ACTA AUTOMATICA SINICA · 2009

摘要: 为了克服传统主元分析(Principal component analysis, PCA)因模式复合现象而无法进行多故障诊断和诊断结果难以解释的不足, 本文引入指定元分析(Designated component analysis, DCA)的思想, 建立DCA多故障诊断理论的空间投影框架, 从而把异常检测问题转化为将观测数据向故障子空间投影后投影能量的显著性检测问题. 在确定系统存在异常的情况下, 再将观测数据向故障子空间中各故障模式方向分别进行投影, 根据投影能量的显著性进行多故障诊断. 并利用正交补空间构造法证明了基于非正交模式指定元分解形式的可行性和收敛性, 建立了一种逐步DCA多故障诊断方法以解决指定模式非正交情况下的多故障诊断问题. 包含5种共存故障的观测数据的仿真研究验证了新方法的有效性. 关键词: 投影框架 / 非正交模式 / 多故障诊断 / 指定元分析 / 主元分析

Cited by 11

Composition of multiple faults in RAMs

Janusz Brzozowski, Helmut Jürgensen · 2002

Single cell-array faults in RAMs are usually represented by Mealy automata. Multiple faults should also be representable by automata; in fact, it should be possible to compute the automaton of a multiple fault from the automata of the single faults that make up the multiple fault. We study properties of binary composition operations on automata for the representation of multiple faults in RAMs. First, we derive a set of generic conditions that every composition operation must satisfy. Second, we develop a set of physical conditions that the composition must satisfy in order to apply to stuck-at, transition and coupling faults in RAMs. Third, we represent the transition table rules used by van de Goor and Smit (1993, 1994) by a composition operation and prove that this operation satisfies both the generic and physical conditions. Fourth, we point out that it may be appropriate to use a different composition operation to permit a different handling of coupling faults in the presence of stuck-at or transition faults.

Cited by 1

Representing Gate-Level SET Faults by Multiple SEU Faults at RTL

Ahmet Çağrı Bağbaba, Maksim Jenihhin, Raimund Ubar et al. · arXiv (Cornell University) · 2020

The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault injection campaigns for gate-level designs suffer from huge execution times. Therefore, designers need to apply early design evaluation techniques to reduce the execution time of fault injection campaigns. In this work, we propose a method to represent gate-level Single-Event Transient (SET) faults by multiple Single-Event Upset (SEU) faults at the Register-Transfer Level. Introduced approach is to identify true and false logic paths for each SET in the flip-flops' fan-in logic cones to obtain more accurate sets of flip-flops for multiple SEUs injections at RTL. Experimental results demonstrate the feasibility of the proposed method to successfully reduce the fault space and also its advantage with respect to state of the art. It was shown that the approach is able to reduce the fault space, and therefore the fault-injection effort, by up to tens to hundreds of times.

Cited by 4Open access

Transmission Line Multiple Faults Detection and Identification.

Mr. Vinay Kumar H, R. Kavya, U.Radhika et al. · Zenodo (CERN European Organization for Nuclear Research) · 2025

Transmission line cable system is a common practice followed in urban areas. While a fault occurs due to many reasons in the cable, at a time of removing or repairing process, there is difficulty in locating the exact location of the fault. The system proposed in this system is used to find out the exact location of the fault and display it to the dedicated website over the internet using Wi-Fi module, giving prior information to the authorized person at another end.

Cited by 0Open access

Locating faults using multiple spectra-specific models

Kai Yu, Mengxiang Lin, Qing Gao et al. · 2011

Spectra-based fault localization (SFL) techniques have brought encouraging results and a variety of program spectra have been proposed to locate faults. Different types of abnormal behaviors may be revealed by different kinds of spectra. Compared to techniques using single spectra type, techniques combining multiple types of spectra try to leverage the strengths of the constituent types. However, in the presence of multiple kinds of spectra, how to select adequate spectra type and build appropriate models need further investigation.

Cited by 42

Digital analysis of multiple faults in GIS

S. Meijer, Ε. Gulski, J.J. Smit et al. · 2002

Digital analysis of PD is a well-known tool to recognize faults in SF/sub 6/ gas insulated systems. In this paper investigations into UHF PD signals from two simultaneously occurring faults in GIS are reported. The studied cases comprise a particle fixed to an insulator, free moving particles and a combination of both: multiple faults. It is shown that using advanced signal processing, it is possible to distinguish between these situations using digital discrimination tools.

Cited by 5

Diagnosis of Multiple Faults: A Sensitivity Analysis

David Heckerman, Michael Shwe · arXiv (Cornell University) · 2013

We compare the diagnostic accuracy of three diagnostic inference models: the simple Bayes model, the multimembership Bayes model, which is isomorphic to the parallel combination function in the certainty-factor model, and a model that incorporates the noisy OR-gate interaction. The comparison is done on 20 clinicopathological conference (CPC) cases from the American Journal of Medicine-challenging cases describing actual patients often with multiple disorders. We find that the distributions produced by the noisy OR model agree most closely with the gold-standard diagnoses, although substantial differences exist between the distributions and the diagnoses. In addition, we find that the multimembership Bayes model tends to significantly overestimate the posterior probabilities of diseases, whereas the simple Bayes model tends to significantly underestimate the posterior probabilities. Our results suggest that additional work to refine the noisy OR model for internal medicine will be worthwhile.

Cited by 0Open access